Mass Production Test Handler for MEMS
Neo Handler is the first class OSAI equipment for testing Semiconductor MEMS Sensors components. The small footprint (900 x 1600mm) and a scalable architecture allow to dramatically reduce the cost of test.
High flexibility, in addition to several combination of I/O feeding (from Direct die to tube feeding), offer an hi-end test handler solution with low operative and investment costs.
The wide range of scalability features offered in OSAI equipment configuration range:
- Multi sites test socket (up to 140 sites)
- Multi sites pick up tools (up to 35 sites)
- Stimuli units (Pressure, GAS, Temperature, Humidity, Microphones, Magnetic, Inertial)
Entirely developed by OSAI, Neo Handler can test several MEMS sensors types and geometries.
Suitable for: Mems microphones, Mems speaker, voice coil micro-speakers, dual armature speakers, optical microphones
Input/output media: Jedec trays, Tape and reel, direct die feeding
Bin Formats: Bin boxes, 4” waffle trays
Test Handler capability: Up to 35 indipendent sites
Per picker handling technology: ≤ 1/10K jam rate
Compact footprint: Low index time, High throughput
Acoustic stimuli: Per site Individual stimuli unit, Modular test socket architecture, High SNR test capability (up to 80dB)
Production traceability feature available
Suitable for: Geomagnetic sensors, angular sensors, hall effect sensors, speed sensors
Input/output media: Jedec trays, Tape and reel
Bin Formats: Bin boxes, 4’’ waffle trays
Test Handler capability: Up to 280 indipendent sites (ping pong configuration), Per picker Handling technology, ≤ 1/10K jam rate, Compact footprint, Low index time, High throughput, Amagnetic pick-up and contacting units
Stimuli unit: Integrated on handler working area (ATE Head hard docking)
Production traceability feature available
Suitable for: Pressure senors, temperature sensors, GAS sensors, humidity sensors, waterproof pressure sensors, differential pressure sensors
Input/output media: Jedec trays, Tape and reel, direct die feeding
Bin Formats: Bin boxes, 4” waffle trays
Test Handler capability: Up to 280 indipendent sites (ping pong configuration), Active vacuum pressure control from 1 to 0 bar (g), Per picker Handling technology, ≤ 1/10K jam rate, Compact footprint, Low index time, High throughput
Temperature stimuli: Standard and automotive temperature range, High precision dynamic soak technology, up to 4°C/sec
Pressure stimuli: Pressure range: from 0 up to 2 bar (a), Fast settling time (up to 3 pre-pressurized tanks available as option), Configurable controller according to the accuracy required
GAS stimuli: Up to 4 GAS lines inlets, Supported Gases: CO2, Isobutilene, Hetanol, Methane, Automatic flushing procedure for Gas change, 2 Programmable working mode: Constant GAS Atmosphere, Pressurized GAS Atmosphere
Humidity stimuli: Range: 0…95% RH, Accuracy: ±4% RH , ±1% Flow, flow rate up to 10l/min, 2 Programmable working mode: Constant Humidity flow, Pressurized humid Atmosphere
Production traceability feature available
Mass Production Test Handler for MEMS
Neo Handler is the first class OSAI equipment for testing Semiconductor MEMS Sensors components. The small footprint (900 x 1600mm) and a scalable architecture allow to dramatically reduce the cost of test.
High flexibility, in addition to several combination of I/O feeding (from Direct die to tube feeding), offer an hi-end test handler solution with low operative and investment costs.
The wide range of scalability features offered in OSAI equipment configuration range:
- Multi sites test socket (up to 140 sites)
- Multi sites pick up tools (up to 35 sites)
- Stimuli units (Pressure, GAS, Temperature, Humidity, Microphones, Magnetic, Inertial)
Entirely developed by OSAI, Neo Handler can test several MEMS sensors types and geometries.
Suitable for: Mems microphones, Mems speaker, voice coil micro-speakers, dual armature speakers, optical microphones
Input/output media: Jedec trays, Tape and reel, direct die feeding
Bin Formats: Bin boxes, 4” waffle trays
Test Handler capability: Up to 35 indipendent sites
Per picker handling technology: ≤ 1/10K jam rate
Compact footprint: Low index time, High throughput
Acoustic stimuli: Per site Individual stimuli unit, Modular test socket architecture, High SNR test capability (up to 80dB)
Production traceability feature available
Suitable for: Geomagnetic sensors, angular sensors, hall effect sensors, speed sensors
Input/output media: Jedec trays, Tape and reel
Bin Formats: Bin boxes, 4’’ waffle trays
Test Handler capability: Up to 280 indipendent sites (ping pong configuration), Per picker Handling technology, ≤ 1/10K jam rate, Compact footprint, Low index time, High throughput, Amagnetic pick-up and contacting units
Stimuli unit: Integrated on handler working area (ATE Head hard docking)
Production traceability feature available
Suitable for: Pressure senors, temperature sensors, GAS sensors, humidity sensors, waterproof pressure sensors, differential pressure sensors
Input/output media: Jedec trays, Tape and reel, direct die feeding
Bin Formats: Bin boxes, 4” waffle trays
Test Handler capability: Up to 280 indipendent sites (ping pong configuration), Active vacuum pressure control from 1 to 0 bar (g), Per picker Handling technology, ≤ 1/10K jam rate, Compact footprint, Low index time, High throughput
Temperature stimuli: Standard and automotive temperature range, High precision dynamic soak technology, up to 4°C/sec
Pressure stimuli: Pressure range: from 0 up to 2 bar (a), Fast settling time (up to 3 pre-pressurized tanks available as option), Configurable controller according to the accuracy required
GAS stimuli: Up to 4 GAS lines inlets, Supported Gases: CO2, Isobutilene, Hetanol, Methane, Automatic flushing procedure for Gas change, 2 Programmable working mode: Constant GAS Atmosphere, Pressurized GAS Atmosphere
Humidity stimuli: Range: 0…95% RH, Accuracy: ±4% RH , ±1% Flow, flow rate up to 10l/min, 2 Programmable working mode: Constant Humidity flow, Pressurized humid Atmosphere
Production traceability feature available
